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Other articles related with "grad dose"：
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96110 |
Lili Ding(丁李利), Simone Gerardin, Marta Bagatin, Dario Bisello, Serena Mattiazzo, Alessandro Paccagnella |
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Comparison of radiation degradation induced by x-rayand 3-MeV protons in 65-nm CMOS transistors |
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Chin. Phys. B
2016 Vol.25 (9): 96110-096110
[Abstract]
(781)
[HTML 1 KB]
[PDF 251 KB]
(325)
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